讲座通知🌤：
德国联邦物理技术研究院(PTB) Koenders教授扫描探针显微镜(SPM)技术系列专题讲座
主题: 扫描隧道显微镜（STM），原子力显微镜（AFM）和扫描电子显微 （SEM）的原理及应用
时间及地点：5月15日下午1:30-3🥖：00杏运官网平台报告厅（STM）；
5月17日下午1:30-3：00杏运官网平台报告厅（AFM）；
5月19日下午1:30-3⚁：00杏运官网平台报告厅（SEM）🤽🏼；
欢迎全校师生踊跃参加！
讲座摘要：
Scanning tunneling microscope, Atomic for microscope and Scanning electrical microscope are also reference as scanning probe microscopes (SPM). While the pure imaging capabilities of SPM techniques is dominated by the application of these methods at their early development stages, the physics of probe–sample interactions and the quantitative analyses of tribological, electronic, magnetic, biological, and chemical surfaces have now become of increasing interest. Nanoscale science and technology are strongly driven by SPMs which allow investigation and manipulation of surfaces down to the atomic scale. With growing understanding of the underlying interaction mechanisms, SPMs have found applications in many fields outside basic research fields. In addition, various derivatives of all these methods have been developed for special applications, some of them targeted far beyond microscopy.
The Scanning Tunneling Microscope (STM) developed by Dr.Gerd Binnig and his colleagues in 1981 at the IBM Zurich Research Laboratory, Rueschlikon, Switzerland, is the first instrument capable of directly obtaining three-dimensional (3-D) images of solid surfaces with atomic resolution. While. STMs can only be used to study surfaces which are electrically conductive to some degree. In 1985, Binnig et al. developed an Atomic Force Microscope (AFM) to measure ultra-small forces (less than 1μN) present between the AFM tip surface and the sample surface. AFMs can be used for measurement of all engineering surfaces which may be either electrically conductive or insulating. The AFM has become a popular surface profiler for topographic and normal force measurements on the micro to nanoscale. Scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surface topography and composition. The electron beam is generally scanned in a raster scan pattern, and the beam's position is combined with the detected signal to produce an image. SEM can achieve resolution better than 1 nanometer. Specimens can be observed in high vacuum, in low vacuum, in wet conditions (in environmental SEM), and at a wide range of cryogenic or elevated temperatures.
[3]. Yacoot, A. and Koenders, L; Recent developments in dimensional nanometrology using AFMs, Meas. Sci. Technol. 22 (2011) 122001 (12pp), doi:10.1088/0957-0233/22/12/122001
[4]. Dai, G., Häßler-Grohne, W., Hüser, D., Wolff, H., Danzebrink, H.-U., Koenders, L. Bosse, H.; Development of a 3D AFM for true 3D measurements of nanostrucutures, Measurement Science and Technology 22 (2011) 094009 doi:10.1088/0957-0233/22/9/094009
[5]. Yacoot, A., Koenders, L.; (Topical Review) Aspects of scanning force microscope probes and their effects on dimensional measurement, J. Phys. D: Appl. Phys. 41 (2008) 103001 doi:10.1088/0022-3727/41/10/103001 (46pp)
Book:
[1] Wilkening, G., Koenders, L., Nanoscale Calibration Standards and Methods - Dimensional and Related Measurements in the Micro- and Nanometer Range, 2005. XXII, 519 pages, Hardcover, Wiley-VCH, Berlin